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Merck
CN

634867

Silicon dioxide

single crystal substrate, optical grade, 99.99% trace metals basis, L × W × thickness 10 mm × 10 mm × 0.5 mm

Synonym(s):

Cristobalite, Quartz, Sand, Silica

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About This Item

Linear Formula:
SiO2
CAS Number:
60676-86-0
Molecular Weight:
60.08
NACRES:
NA.23
PubChem Substance ID:
24882697
UNSPSC Code:
12352303
EC Number:
262-373-8
MDL number:
MFCD00011232

Key Documents

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Product Name

Silicon dioxide, single crystal substrate, optical grade, 99.99% trace metals basis, L × W × thickness 10 mm × 10 mm × 0.5 mm

InChI

1S/O2Si/c1-3-2

InChI key

VYPSYNLAJGMNEJ-UHFFFAOYSA-N

SMILES string

O=[Si]=O

grade

optical grade

assay

99.99% trace metals basis

form

solid

hardness

7.0 mohs

L × W × thickness

10 mm × 10 mm × 0.5 mm

refractive index

n20/D 1.544 (lit.)

mp

1610 °C (lit.)

transition temp

Tm 573.1 °C (phase change)

density

2.6 g/mL at 25 °C (lit.)
2.684 g/mL

Quality Level

100

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Application

SiO2 is majorly used as a substrate material with excellent thermo-mechanical properties in a variety of applications which include:
  • vapour deposition
  • phase deposition
  • atomic force microscopy probes(AFM)
  • spin coating
  • electronic based devices

Features and Benefits

An excellent substrate for microwave filters for applications in the wireless communication arena.

Other Notes

specific heat = 0.18 cal/g; thermoelectric constant = 1200μV/°C @ 300 °C; thermal conductivity = 0.0033 cal/cm°C; themal expansion (x10-6) = α11: 13.71, α33: 7.48; Q value = 1.8 × 106 min; acoustic velocity, SAW = 3160 m/sec; frequency constant, BAW = 1661 kHz/mm; piezoelectric coupling = K2 BAW: 0.65%, SAW: 0.14%

Physical form

Crystalline, hexagonal (a = 4.914 Å, c = 5.405 Å)

Storage Class

13 - Non Combustible Solids

wgk

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

dust mask type N95 (US), Eyeshields, Gloves

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Certificates of Analysis (COA)

Lot/Batch Number
BCCL7789
BCCK3793
BCCK8737
BCCH5972
BCCD6553

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Exciton diffusion measurements in poly (3-hexylthiophene).
Shaw PE, et al.
Advanced Materials, 20(18), 3516-3520 (2008)
The effect of calcination temperature on the surface microstructure and photocatalytic activity of TiO2 thin films prepared by liquid phase deposition.
Yu J, et al.
The Journal of Physical Chemistry B, 107(50), 13871-13879 (2003)
Electrical and optical properties of ZnO transparent conducting films by the sol-gel method.
Lee J, et al.
Journal of Crystal Growth, 247(1-2), 119-125 (2003)
Oxygen-aided synthesis of polycrystalline graphene on silicon dioxide substrates.
Chen J, et al.
Journal of the American Chemical Society, 133(44), 17548-17551 (2011)
Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate.
Whittaker JD, et al.
Nano Letters, 6(5), 953-957 (2006)
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