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Merck
CN

15747

Silicon Standard for ICP

TraceCERT®, 1 g/L Si in NaOH (nominal concentration)

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About This Item

NACRES:
NA.24
UNSPSC Code:
41116107

Key Documents

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grade

certified reference material, TraceCERT®

product line

TraceCERT®

concentration

1 g/L Si in NaOH (nominal concentration)

technique(s)

ICP: suitable

application(s)

industrial qc
pharmaceutical

format

single component solution

Quality Level

300

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General description

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

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Application

50 ng/g of Silicon standard may be used to improve maximum signal-to-background intensity ratios (SBR) during High-resolution inductively coupled plasma mass spectrometry (HR-ICP-MS).

Analysis Note

1 g/L Si in 2% sodium hydroxide, prepared with high purity Si, NaOH and water

Other Notes

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information and example certificates, please visit our ICP & AAS standards website

Legal Information

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

pictograms

Corrosion
GHS05

signalword

Danger

hcodes

H290,H314

Hazard Classifications

Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B

Storage Class

8B - Non-combustible corrosive hazardous materials

wgk

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter

Certificates of Analysis (COA)

Search for Certificates of Analysis (COA) by entering the products Lot/Batch Number. Lot and Batch Numbers can be found on a product’s label following the words ‘Lot’ or ‘Batch’.

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Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS.
Pohl, Pawel, et al.
Journal of Analytical Atomic Spectrometry, 25.9, 1461-1466 (2010)

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