49500
Sieve Standard, traceable to NIST SRM
63 μm (230 mesh)
Synonym(s):
Sieve calibration standard, 63 μm (230 mesh)
Sign In to View Organizational & Contract Pricing.
Select a Size
Change View
About This Item
NACRES:
NA.24
UNSPSC Code:
41116107
grade
analytical standard
form
particles
manufacturer/tradename
Whitehouse Scientific Ltd SS397
particle size
63 μm (230 mesh)
application(s)
glass & ceramic
industrial qc
pharmaceutical
format
neat
General description
Sieve Standard, traceable to NIST SRM is ideal for profiling particle size distribution (PSD) of a particle system.
The particle diameter of 63 μm (230 mesh) is measured using electroformed sieves and glass microsphere method.
The particle diameter of 63 μm (230 mesh) is measured using electroformed sieves and glass microsphere method.
Application
Used to validate and test particle size equipment.
Also used as a sieve calibration standard for:
Also used as a sieve calibration standard for:
- characterizing electroformed sieves
- investigating the effect of particle size on dissolution kinetics of magnesium leaching in titanium production
Features and Benefits
- suitable for routine instrument calibration checks, testing and corrections
- traceable to NIST and SRM standards
- available as a neat sample
Still not finding the right product?
Explore all of our products under Sieve Standard, traceable to NIST SRM
Storage Class
13 - Non Combustible Solids
wgk
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
Eyeshields, Gloves, type N95 (US)
Regulatory Information
新产品
This item has
Choose from one of the most recent versions:
Already Own This Product?
Find documentation for the products that you have recently purchased in the Document Library.
Related Content
Particle size conversion table from our Lab Basics Technical Library
Factors affecting the leaching mechanism of Mg bearing oxide impurities in Hydrogen Assisted Magnesiothermic Reduction (HAMR) of TiO2
Sarkar S, et al.
Chemosphere, 16, 100259-100259 (2020)
Sieve Calibration-a New Simple but High Precision Approach
Rideal GR, et al.
Particle & Particle Systems Characterization, 17(2), 77-82 (2000)