Skip to Content
Merck
CN

83340

Sand, white quartz

purum p.a., powder

Synonym(s):

Quartz, Silicon dioxide

Sign In to View Organizational & Contract Pricing.

Select a Size

Change View

About This Item

Linear Formula:
SiO2
CAS Number:
Molecular Weight:
60.08
NACRES:
NA.21
PubChem Substance ID:
UNSPSC Code:
12352300
EC Number:
238-878-4
MDL number:
Technical Service
Need help? Our team of experienced scientists is here for you.
Let Us Assist


grade

purum p.a.

Quality Segment

form

powder

loss

≤0.3% loss on ignition, 900 °C

particle size

>230 mesh

anion traces

chloride (Cl-): ≤50 mg/kg

cation traces

Ca: ≤200 mg/kg, Cd: ≤50 mg/kg, Co: ≤50 mg/kg, Cu: ≤50 mg/kg, Fe: ≤200 mg/kg, K: ≤1000 mg/kg, Na: ≤150 mg/kg, Ni: ≤50 mg/kg, Pb: ≤100 mg/kg, Zn: ≤50 mg/kg

SMILES string

O=[Si]=O

InChI

1S/O2Si/c1-3-2

InChI key

VYPSYNLAJGMNEJ-UHFFFAOYSA-N

General description

The product is sand, white quartz (SiO2). Its reaction with alkaline NaNO3 solutions containing dissolved Al at 89°C has been investigated.

Application

Sand, white quartz (quartz) has been employed as a solid sample to evaluate the pore-volume variations during fluid-rock interaction experiments.

Analysis Note

metal and chloride traces refer to acid-soluble parts


Still not finding the right product?

Explore all of our products under Sand, white quartz


pictograms

Health hazard

signalword

Danger

hcodes

Hazard Classifications

STOT RE 1 Inhalation

target_organs

Lungs

Storage Class

6.1D - Non-combustible acute toxic Cat.3 / toxic hazardous materials or hazardous materials causing chronic effects

wgk

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable



Choose from one of the most recent versions:

Certificates of Analysis (COA)

Lot/Batch Number

It looks like we've run into a problem, but you can still download Certificates of Analysis from our Documents section.

If you need assistance, please contact Customer Support

Already Own This Product?

Find documentation for the products that you have recently purchased in the Document Library.

Visit the Document Library