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Merck
CN

334103

氮化硅

powder, ≥99.9% trace metals basis

别名:

Trisilicon tetranitride

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关于此项目

线性分子式:
Si3N4
化学文摘社编号:
分子量:
140.28
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12352300
EC Number:
234-796-8
MDL number:
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产品名称

氮化硅, powder, ≥99.9% trace metals basis

InChI key

HQVNEWCFYHHQES-UHFFFAOYSA-N

InChI

1S/N4Si3/c1-5-2-6(1)3(5)7(1,2)4(5)6

SMILES string

N12[Si]34N5[Si]16N3[Si]25N46

assay

≥99.9% trace metals basis

form

powder

particle size

<1 μm

density

3.44 g/mL at 25 °C (lit.)

Quality Level

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General description

氮化硅基陶瓷具有较高的断裂韧性、硬度和耐磨性、耐腐蚀性、热稳定性已知的氮化硅多晶型有两种,α和β Si3N4,它们都具有六方结构。一项研究表明,研究人员还合成了第三种形态,立方尖晶石结构。

存储类别

11 - Combustible Solids

wgk

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

dust mask type N95 (US), Eyeshields, Gloves


历史批次信息供参考:

分析证书(COA)

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Synthesis of cubic silicon nitride
Zerr A, et al
Nature, 400, 340-342 null
Silicon Nitride and Related Materials
Riley FR
Journal of the American Ceramic Society. American Ceramic Society, 83(2), 245-265 (2000)
Simone P Rodrigues et al.
Journal of materials science. Materials in medicine, 24(1), 231-239 (2012-10-12)
Commercial femoral head prostheses (cobalt-chromium alloy, yttria partially stabilized zirconia (Y-PSZ) and alumina) and new silicon nitride ceramic ones (nanocrystalline diamond coated and uncoated) were compared in terms of artifact level production by computed tomography (CT). Pelvis examination by CT
Chang-Hyun Park et al.
Optics express, 20(21), 23769-23777 (2012-11-29)
A nanophotonic polarization-independent visible wavelength filter is presented, incorporating a symmetric metal-dielectric resonant structure on quartz substrate, where a sub-wavelength grating, made up of a two-dimensional array of Al square sheets, is integrated with a Si(3)N(4) slab waveguide via an
Tingyin Ning et al.
Optics express, 21(2), 2012-2017 (2013-02-08)
We report on strong UV third-harmonic generation from silicon nitride films and resonant waveguide gratings. We determine the absolute value of third-order susceptibility of silicon nitride at wavelength of 1064 nm to be χ(³) (-3ω,ω,ω,ω) = (2.8 ± 0.6) ×

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