342890
二氧化硅
−325 mesh, 99.5% trace metals basis
别名:
方石英, 石英, 砂石, 硅石
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关于此项目
线性分子式:
SiO2
化学文摘社编号:
分子量:
60.08
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12352303
EC Number:
262-373-8
MDL number:
InChI key
VYPSYNLAJGMNEJ-UHFFFAOYSA-N
InChI
1S/O2Si/c1-3-2
SMILES string
O=[Si]=O
assay
99.5% trace metals basis
form
powder
refractive index
n20/D 1.544 (lit.)
particle size
−325 mesh
mp
1610 °C (lit.)
density
2.6 g/mL at 25 °C (lit.)
application(s)
battery manufacturing
Quality Level
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Application
SiO2主要用作具有良好热机械性质的基质材料，可用于各种应用，包括：气相沉积、相沉积、原子力显微镜探针(AFM)、旋转涂覆、电子设备。
Other Notes
其可能含有吸附的H2O和CO2，这些组分可通过在>900°C下煅烧除去
存储类别
13 - Non Combustible Solids
wgk
nwg
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
dust mask type N95 (US), Eyeshields, Gloves
Oxygen-aided synthesis of polycrystalline graphene on silicon dioxide substrates.
Chen J, et al.
Journal of the American Chemical Society, 133(44), 17548-17551 (2011)
Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate.
Whittaker JD, et al.
Nano Letters, 6(5), 953-957 (2006)
Growth model of bamboo-shaped carbon nanotubes by thermal chemical vapor deposition.
Lee CJ and Park J
Applied Physics Letters, 77(21), 3397-3399 (2000)
Exciton diffusion measurements in poly (3-hexylthiophene).
Shaw PE, et al.
Advanced Materials, 20(18), 3516-3520 (2008)
Electrical and optical properties of ZnO transparent conducting films by the sol-gel method.
Lee J, et al.
Journal of Crystal Growth, 247(1-2), 119-125 (2003)
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