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Merck
CN

946974

三仲丁氧基铝

≥99.9% trace metals basis

别名:

仲丁醇铝

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关于此项目

线性分子式:
Al[OCH(CH3)C2H5]3
化学文摘社编号:
分子量:
246.32
UNSPSC Code:
12352103
Beilstein/REAXYS Number:
3910908
MDL number:
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Quality Segment

assay

Al basis (%, EDTA titration), ≥99.9% trace metals basis (ICP-MASS/ICP-OES), ≥99.9% trace metals basis

form

liquid

autoignition temp.

763 °F

expl. lim.

9.8 %

impurities

<1000 ppmtrace (metals basis)

bp

200-206 °C/30 mmHg (lit.)

mp

200-206 °C

density

0.967 g/mL at 25 °C (lit.), 0.967 g/cm3

application(s)

semiconductor
semiconductor

SMILES string

CCC(C)O[Al](OC(C)CC)OC(C)CC

InChI

1S/3C4H9O.Al/c3*1-3-4(2)5;/h3*4H,3H2,1-2H3;/q3*-1;+3

InChI key

WOZZOSDBXABUFO-UHFFFAOYSA-N

General description

Aluminum-tri-sec-butoxide, a non-pyrophoric sol-gel precursor, appears as a colorless liquid. Highly moisture-sensitive, it readily hydrolyzes to aluminum oxide derivatives. Our ≥99.9% trace metals basis grade ensures ultra-low impurities for precise deposition, which is suitable for the synthesis of Al2O3 via atomic layer deposition (ALD) and Chemical vapor deposition (CVD) along with sol-gel precursors.

Application

Aluminum-tri-sec-butoxide or ATSB can be used

- As a suitable Al precursor for the synthesis of Al2O3 thin films via atomic layer desposition(ALD) and Chemical vapor deposition (CVD).

- As a precursor for the fabrication of Amorphous alumina–titania (Al2O3–TiO2) films on silicon substrates using low-pressure CVD along with titanium tetrachloride (TiCl4) with varying CO2 and H2 gas flows (ATSB/TiCl4/CO2/H2 system). Our Aluminum-tri-sec-butoxide (ATSB) with a purity of ≥99.9% trace metals basis is a highly valuable precursor for advanced thin film applications due to its exceptional purity and consistent performance. Its low impurity levels ensure minimal contamination, which is critical for producing uniform and high-quality Al2O3 films via atomic layer deposition (ALD) and chemical vapor deposition (CVD). This high purity contributes to enhanced film properties like improved dielectric strength, chemical stability, and uniform thickness, key factors for semiconductor and microelectronics industries.

Features and Benefits

已用于制备高表面积氧化铝,其中以 2,4-戊二酮(Aldrich 产品 P775-4)作为螯合剂。


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Danger

Hazard Classifications

Acute Tox. 3 Dermal - Acute Tox. 4 Oral - Flam. Liq. 3

存储类别

3 - Flammable liquids

flash_point_f

78.8 °F - closed cup

flash_point_c

26 °C - closed cup



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