342890
Silicon dioxide
−325 mesh, 99.5% trace metals basis
Synonym(s):
Cristobalite, Quartz, Sand, Silica
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About This Item
Linear Formula:
SiO2
CAS Number:
Molecular Weight:
60.08
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12352303
EC Number:
262-373-8
MDL number:
Product Name
Silicon dioxide, −325 mesh, 99.5% trace metals basis
InChI key
VYPSYNLAJGMNEJ-UHFFFAOYSA-N
InChI
1S/O2Si/c1-3-2
SMILES string
O=[Si]=O
assay
99.5% trace metals basis
form
powder
refractive index
n20/D 1.544 (lit.)
particle size
−325 mesh
mp
1610 °C (lit.)
density
2.6 g/mL at 25 °C (lit.)
application(s)
battery manufacturing
Quality Level
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Application
SiO2 is majorly used as a substrate material with excellent thermo-mechanical properties which can be used in a variety of applications which include: vapor deposition, phase deposition, atomic force microscopy probes(AFM), spin coating, electronic based devices.
Other Notes
May contain adsorbed H2O and CO2 which is removable by calcining at >900°C
Storage Class
13 - Non Combustible Solids
wgk
nwg
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
dust mask type N95 (US), Eyeshields, Gloves
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The effect of calcination temperature on the surface microstructure and photocatalytic activity of TiO2 thin films prepared by liquid phase deposition.
Yu J, et al.
The Journal of Physical Chemistry B, 107(50), 13871-13879 (2003)
Exciton diffusion measurements in poly (3-hexylthiophene).
Shaw PE, et al.
Advanced Materials, 20(18), 3516-3520 (2008)
Electrical and optical properties of ZnO transparent conducting films by the sol-gel method.
Lee J, et al.
Journal of Crystal Growth, 247(1-2), 119-125 (2003)
Oxygen-aided synthesis of polycrystalline graphene on silicon dioxide substrates.
Chen J, et al.
Journal of the American Chemical Society, 133(44), 17548-17551 (2011)
Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate.
Whittaker JD, et al.
Nano Letters, 6(5), 953-957 (2006)
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