Padmanathan Karthick Kannan et al.
Chemistry (Weinheim an der Bergstrasse, Germany), 21(26), 9355-9359 (2015-05-23)
Nanostructured NiS thin film was prepared by a one-step electrodeposition method and the structural, morphological characteristics of the as-prepared films were analyzed by X-ray diffractometry (XRD), field emission scanning electron microscopy (FESEM) and energy dispersive X-ray analysis (EDAX). The electrocatalytic