- Sub-100nm pattern generation by laser direct writing using a confinement layer.
Sub-100nm pattern generation by laser direct writing using a confinement layer.
Optics express (2013-04-11)
Jan-Hendrik Klein-Wiele, Peter Simon
PMID23571992
ABSTRACT
A novel technique is introduced that dramatically increases the quality and spatial resolution of directly ablated periodic nanostructures on materials. The presented method utilizes a PMMA confinement layer spin coated on the surface of the ablated material reducing the violence and speed of expansion of the molten material. As a result, droplet formation deteriorating the achievable resolution can be completely avoided. Moreover, motion control of the molten material leads to structural details with dimensions well below the irradiation wavelength.
MATERIALS
Product Number
Brand
Product Description
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), average Mw 97,000 (Typical), average Mn 46,000 (Typical)
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 20,000
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 100,000
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 2,000
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 8,000
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 4,000
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 10,000
Supelco
Poly(methyl methacrylate), analytical standard, suitable for gel permeation chromatography (GPC), 50,000