产品名称
镓ICP标准液, TraceCERT®, 1 g/L Ga in nitric acid (nominal concentration)
grade
certified reference material
TraceCERT®
product line
TraceCERT®
concentration
1 g/L Ga in nitric acid (nominal concentration)
technique(s)
ICP: suitable
application(s)
industrial qc
pharmaceutical
format
single component solution
Quality Level
Analysis Note
溶于 5% 硝酸的 1000mg/L 的 Ga，用高纯 Ga 金属、HNO3 和 水制备。
Application
Gallium standard was used as internal standard for analyzing serum using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF) to determine the concentration of P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb elements.
General description
This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Search & download your certificate here.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Search & download your certificate here.
Other Notes
For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information and example certificates, please visit our ICP & AAS standards website
Legal Information
TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany
signalword
Danger
hcodes
Hazard Classifications
Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B
supp_hazards
存储类别
8B - Non-combustible corrosive hazardous materials
wgk
WGK 2
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter
C G L Canellas et al.
Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine, 70(7), 1277-1280 (2012-03-01)
In this work we analyzed serum samples from patients with Sickle Cell Anemia (SCA) using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF). The SRTXRF measurements were performed at the X-Ray Fluorescence Beamline at the Brazilian National Synchrotron Light Laboratory
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