grade
certified reference material
Quality Segment
packaging
pkg of disk
manufacturer/tradename
NIST®
technique(s)
X-ray spectroscopy: suitable, optical emission spectroscopy (OES): suitable
format
matrix material
General description
Each unit of SRM 1173 contains a disk with a diameter of ~ 32 mm (1 1/4 in) and a thickness of 19 mm (3/4 in).
SRM 1173_cert
SRM 1173_SDS
SRM 1173_cert
SRM 1173_SDS
Application
The SRM is intended for use in optical emission and X-ray spectrometric analysis methods.
Other Notes
Certified for the analytes listed below.
Carbon (C), Manganese (Mn), Phosphorus (P), Sulfur (S), Silicon (Si), Copper (Cu), Nickel (Ni), Chromium (Cr), Vanadium (V), Molybdenum (Mo)
Reference/Informational value is provided for the following analytes.
Niobium(Nb), Titanium (Ti), Cobalt (Co)
See certificate for values and more details at nist.gov/SRM.
Carbon (C), Manganese (Mn), Phosphorus (P), Sulfur (S), Silicon (Si), Copper (Cu), Nickel (Ni), Chromium (Cr), Vanadium (V), Molybdenum (Mo)
Reference/Informational value is provided for the following analytes.
Niobium(Nb), Titanium (Ti), Cobalt (Co)
See certificate for values and more details at nist.gov/SRM.
Legal Information
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology
存储类别
13 - Non Combustible Solids
wgk
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable