Sign In to View Organizational & Contract Pricing.
Select a Size
Change View
About This Item
Linear Formula:
C7H9RuC7H9
CAS Number:
Molecular Weight:
287.36
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12352103
MDL number:
Quality Level
form
liquid
composition
Ru, 33.9-36.4% gravimetric
reaction suitability
core: ruthenium, reagent type: catalyst
refractive index
n20/D 1.5870 (lit.)
bp
100 °C/0.01 mmHg (lit.)
mp
6 °C (lit.)
density
1.3412 g/mL at 25 °C (lit.)
storage temp.
−20°C
SMILES string
[Ru].CC[C]1[CH][CH][CH][CH]1.CC[C]2[CH][CH][CH][CH]2
InChI
1S/2C7H9.Ru/c2*1-2-7-5-3-4-6-7;/h2*3-6H,2H2,1H3;
InChI key
VLTZUJBHIUUHIK-UHFFFAOYSA-N
General description
Bis(ethylcyclopentadienyl)ruthenium(II) is a organometallic compound widely used as a catalyst and as a precursor for thin-film deposition. It is valued for its high thermal stability, volatility, and efficiency in atomic layer deposition (ALD) and chemical vapor deposition (CVD) processes to create high-purity ruthenium and ruthenium oxide films. This compound plays a crucial role in microelectronics, catalysis, and energy materials.
Application
Bis(ethylcyclopentadienyl)ruthenium can be used:
- A precursor to synthesize ruthenium films via the atomic layer deposition (ALD) method.
- A precursor to synthesize ruthenium thin films on substrates such as SiO2 via plasma enhanced atomic layer deposition (PEALD) method.
- A metal-organic precursor in the chemical vapor deposition (CVD) process to deposit ruthenium (Ru) thin films suitable for applications like capacitor electrodes in microelectronics.
- A precursor to prepare ultrathin ruthenium (Ru) films via the atomic layer deposition (ALD) and selective etching techniques.
Features and Benefits
Bis(ethylcyclopentadienyl)ruthenium(II) exhibits:
- High Volatility: Suitable for gas-phase delivery in Chemical Vapor Deposition (CVD) and Atomic Layer Deposition (ALD).
- Thermal Stability: Stable under typical ALD/CVD processing temperatures
Still not finding the right product?
Explore all of our products under Bis(ethylcyclopentadienyl)ruthenium(II)
signalword
Warning
hcodes
Hazard Classifications
Eye Irrit. 2 - Skin Irrit. 2 - STOT SE 3
target_organs
Respiratory system
Storage Class
10 - Combustible liquids
wgk
WGK 3
flash_point_f
>199.9 °F - closed cup
flash_point_c
> 93.3 °C - closed cup
ppe
Eyeshields, Gloves, type ABEK (EN14387) respirator filter
Choose from one of the most recent versions:
Already Own This Product?
Find documentation for the products that you have recently purchased in the Document Library.
Thermal atomic layer deposition (ALD) of Ru films for Cu direct plating.
Choi SH, et al.
Journal of the Electrochemical Society, 158(6), D351-D356 (2011)
Atomic layer deposition of Ruthenium on different interfaces for an advanced metallization system of ICs
Smirnova, EA and Miakonkikh, et al.
Journal of Physics. Conference Series, 1695, 012045-012045 (2020)
Growth mechanism of Ru films prepared by chemical vapor deposition using bis (ethylcyclopentadienyl) ruthenium precursor
Matsui, Yuichi and Hiratani, et al.
Electrochemical and Solid-State Letters, 4, C9-C9 (2001)
Global Trade Item Number
| SKU | GTIN |
|---|---|
| 648663-2G | 04061833390146 |
