Skip to Content
Merck
CN

95584

Xenon difluoride

purum, ≥97.0% (F)

Synonym(s):

Xenon(II) fluoride

Sign In to View Organizational & Contract Pricing.

Select a Size

About This Item

Linear Formula:
XeF2
CAS Number:
13709-36-9
Molecular Weight:
169.29
UNSPSC Code:
12352300
PubChem Substance ID:
24890174
EC Number:
237-251-2
MDL number:
MFCD00040538

Key Documents

View All Documentation
Technical Service
Need help? Our team of experienced scientists is here for you.
Let Us Assist
Technical Service
Need help? Our team of experienced scientists is here for you.
Let Us Assist

vapor pressure

3.8 mmHg ( 25 °C)

grade

purum

assay

≥97.0% (F)

mp

129 °C (lit.)

density

4.32 g/mL at 25 °C (lit.)

SMILES string

F[Xe]F

InChI

1S/F2Xe/c1-3-2

InChI key

IGELFKKMDLGCJO-UHFFFAOYSA-N

Looking for similar products? Visit Product Comparison Guide

Other Notes

Fluorinating agent

signalword

Danger

Hazard Classifications

Acute Tox. 1 Inhalation - Acute Tox. 3 Oral - Eye Dam. 1 - Ox. Sol. 2 - Skin Corr. 1B

Storage Class

5.1B - Oxidizing hazardous materials

wgk

WGK 3

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

Eyeshields, Faceshields, Gloves, type P3 (EN 143) respirator cartridges

Regulatory Information

新产品

This item has

Choose from one of the most recent versions:

Certificates of Analysis (COA)

Lot/Batch Number

It looks like we've run into a problem, but you can still download Certificates of Analysis from our Documents section.

If you need assistance, please contact Customer Support

Already Own This Product?

Find documentation for the products that you have recently purchased in the Document Library.

Visit the Document Library

V.V. Bardin and Y.L. Yagupolskii et al.
New Fluorinating Agents in Organic Synthesis null
Minseob Kim et al.
Nature chemistry, 2(9), 784-788 (2010-08-24)
The application of pressure, internal or external, transforms molecular solids into extended solids with more itinerant electrons to soften repulsive interatomic interactions in a tight space. Examples include insulator-to-metal transitions in O(2), Xe and I(2), as well as molecular-to-non-molecular transitions
Neil Vasdev et al.
Inorganic chemistry, 49(19), 8997-9004 (2010-08-31)
The existence of the trifluoroxenate(II) anion, XeF(3)(-), had been postulated in a prior NMR study of the exchange between fluoride ion and XeF(2) in CH(3)CN solution. The enthalpy of activation for this exchange, ΔH(⧧), has now been determined by use
Tsung Yi Chiang et al.
Journal of synchrotron radiation, 17(1), 69-74 (2009-12-24)
The synchrotron radiation (SR) stimulated etching of silicon elastomer polydimethylsiloxane (PDMS) using XeF(2) as an etching gas has been demonstrated. An etching system with differential pumps and two parabolic focusing mirrors was constructed to perform the etching. The PDMS was
S S Nabiev
Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy, 56A(8), 1589-1611 (2000-07-25)
Raman spectra of XeF4 and XeF6 in the nonaqueous HF solutions at various concentrations and vibrational spectra of the [XeF5]+ cation in the solid state and in the HF solutions over a wide range of vibrational frequencies have been studied.
View All Related Papers

Our team of scientists has experience in all areas of research including Life Science, Material Science, Chemical Synthesis, Chromatography, Analytical and many others.

Contact Technical Service