Merck
CN
  • Sub-100nm pattern generation by laser direct writing using a confinement layer.

Sub-100nm pattern generation by laser direct writing using a confinement layer.

Optics express (2013-04-11)
Jan-Hendrik Klein-Wiele, Peter Simon
摘要

A novel technique is introduced that dramatically increases the quality and spatial resolution of directly ablated periodic nanostructures on materials. The presented method utilizes a PMMA confinement layer spin coated on the surface of the ablated material reducing the violence and speed of expansion of the molten material. As a result, droplet formation deteriorating the achievable resolution can be completely avoided. Moreover, motion control of the molten material leads to structural details with dimensions well below the irradiation wavelength.

材料
货号
品牌
产品描述

Sigma-Aldrich
聚甲基丙烯酸甲酯
Sigma-Aldrich
聚甲基丙烯酸甲酯, average Mw ~350,000 by GPC
Sigma-Aldrich
聚甲基丙烯酸甲酯, average Mw ~15,000 by GPC, powder
Sigma-Aldrich
聚甲基丙烯酸甲酯
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 2,000
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 100,000
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 2,480,000
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 10,000
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, average Mw 97,000 (Typical), average Mn 46,000 (Typical)
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 4,000
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 50,000
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 20,000
Sigma-Aldrich
等规聚(甲基丙烯酸甲酯), >80% isotactic
Supelco
聚甲基丙烯酸甲酯, analytical standard, for GPC, 8,000