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Merck
CN

634670

钛酸锶

single crystal substrate, <110>, ≥99.99% trace metals basis

别名:

Strontium titanium trioxide

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线性分子式:
SrTiO3
化学文摘社编号:
分子量:
183.49
UNSPSC Code:
12352300
PubChem Substance ID:
EC Number:
235-044-1
MDL number:
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InChI key

VEALVRVVWBQVSL-UHFFFAOYSA-N

InChI

1S/3O.Sr.Ti/q;2*-1;+2;

SMILES string

[Sr++].[O-][Ti]([O-])=O

description

single side polished

assay

≥99.99% trace metals basis

dielectric constant

~300

hardness

6 (, Mohs)

L × W × thickness

10 mm × 10 mm × 0.5 mm

mp

2060 °C (lit.)

solubility

H2O: insoluble

density

4.81 g/mL at 25 °C (lit.)

semiconductor properties

<110>

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Features and Benefits

10GHz 时损耗因数:约 5×10-4 (300K),约 3×10-4 (77K)
单晶钛酸锶基底晶格与大多数钙钛矿结构材料都有良好的晶格匹配性。它是很多氧化物薄膜和高温超导体外延生长的良好基底。它也可应用于光学窗口中,作为高质量溅射靶材。

Physical form

cubic (a = 3.905 Å)

存储类别

13 - Non Combustible Solids

wgk

WGK 3

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

Eyeshields, Gloves, type N95 (US)

法规信息

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Polar liquid molecule induced transport property modulation at LaAlO₃/SrTiO₃ heterointerface.
K Au et al.
Advanced materials (Deerfield Beach, Fla.), 24(19), 2598-2602 (2012-04-13)
Tailoring interface structure in highly strained YSZ/STO heterostructures.
A Rivera-Calzada et al.
Advanced materials (Deerfield Beach, Fla.), 23(44), 5268-5274 (2012-02-03)
Shuxin Ouyang et al.
Journal of the American Chemical Society, 134(4), 1974-1977 (2012-01-28)
A strategy of reaction-environment modulation was employed to change the surface property of a semiconductor photocatalyst to enhance its photocatalytic performance. Surface alkalinization induced by a high alkalinity of the solution environment significantly shifted the surface energy band of a
Guanglei Cheng et al.
Nature nanotechnology, 6(6), 343-347 (2011-04-19)
Devices that confine and process single electrons represent an important scaling limit of electronics. Such devices have been realized in a variety of materials and exhibit remarkable electronic, optical and spintronic properties. Here, we use an atomic force microscope tip
Qiang Xu et al.
Ultramicroscopy, 111(7), 912-919 (2011-06-15)
The knowledge of the valence electron distribution is essential for understanding the properties of materials. However this information is difficult to obtain from HREM images because it is easily obscured by the large scattering contribution of core electrons and by

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