95584
二氟代氙
purum, ≥97.0% (F)
别名:
Xenon(II) fluoride
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关于此项目
线性分子式:
XeF2
化学文摘社编号:
分子量:
169.29
UNSPSC Code:
12352300
PubChem Substance ID:
EC Number:
237-251-2
MDL number:
vapor pressure
3.8 mmHg ( 25 °C)
grade
purum
assay
≥97.0% (F)
mp
129 °C (lit.)
density
4.32 g/mL at 25 °C (lit.)
SMILES string
F[Xe]F
InChI
1S/F2Xe/c1-3-2
InChI key
IGELFKKMDLGCJO-UHFFFAOYSA-N
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Other Notes
氟化剂
signalword
Danger
hcodes
Hazard Classifications
Acute Tox. 1 Inhalation - Acute Tox. 3 Oral - Eye Dam. 1 - Ox. Sol. 2 - Skin Corr. 1B
存储类别
5.1B - Oxidizing hazardous materials
wgk
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
Eyeshields, Faceshields, Gloves, type P3 (EN 143) respirator cartridges
法规信息
新产品
此项目有
V.V. Bardin and Y.L. Yagupolskii et al.
New Fluorinating Agents in Organic Synthesis null
Minseob Kim et al.
Nature chemistry, 2(9), 784-788 (2010-08-24)
The application of pressure, internal or external, transforms molecular solids into extended solids with more itinerant electrons to soften repulsive interatomic interactions in a tight space. Examples include insulator-to-metal transitions in O(2), Xe and I(2), as well as molecular-to-non-molecular transitions
Neil Vasdev et al.
Inorganic chemistry, 49(19), 8997-9004 (2010-08-31)
The existence of the trifluoroxenate(II) anion, XeF(3)(-), had been postulated in a prior NMR study of the exchange between fluoride ion and XeF(2) in CH(3)CN solution. The enthalpy of activation for this exchange, ΔH(⧧), has now been determined by use
Tsung Yi Chiang et al.
Journal of synchrotron radiation, 17(1), 69-74 (2009-12-24)
The synchrotron radiation (SR) stimulated etching of silicon elastomer polydimethylsiloxane (PDMS) using XeF(2) as an etching gas has been demonstrated. An etching system with differential pumps and two parabolic focusing mirrors was constructed to perform the etching. The PDMS was
S S Nabiev
Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy, 56A(8), 1589-1611 (2000-07-25)
Raman spectra of XeF4 and XeF6 in the nonaqueous HF solutions at various concentrations and vibrational spectra of the [XeF5]+ cation in the solid state and in the HF solutions over a wide range of vibrational frequencies have been studied.
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