grade
certified reference material
packaging
pkg of wafer
manufacturer/tradename
NIST®
application(s)
pharmaceutical (small molecule)
General description
This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection traceable to the International System of Units (SI) [1] for our reference wavelength. A unit of SRM 2012
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.
SRM 2012_cert SRM 2012 _SDS
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.
SRM 2012_cert SRM 2012 _SDS
Legal Information
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology
存储类别
11 - Combustible Solids
wgk
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
我们的科学家团队拥有各种研究领域经验，包括生命科学、材料科学、化学合成、色谱、分析及许多其他领域.
联系客户支持