等级
certified reference material
包装
pkg of wafer
制造商/商品名称
NIST®
应用
pharmaceutical (small molecule)
一般描述
This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection traceable to the International System of Units (SI) [1] for our reference wavelength. A unit of SRM 2012
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.
SRM 2012_cert SRM 2012 _SDS
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.
SRM 2012_cert SRM 2012 _SDS
法律信息
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology
储存分类代码
11 - Combustible Solids
WGK
WGK 3
闪点(°F)
Not applicable
闪点(°C)
Not applicable
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