US EPA Method 625: GC Analysis of Semivolatiles on SLB^®-5ms

column

SLB-5ms, 30 m x 0.25 mm I.D., 0.25 μm (28471-U)

oven

40 °C (2 min), 22 °C/min to 240 °C, 10 °C/min to 330 °C (5 min)

inj. temp.

250 °C

MSD interface

330 °C

scan range

m/z = 40-450

carrier gas

helium, 1 mL/min constant (10 min), ramped to 1.5 mL/min, hold for remainder of run

injection

1 μL, pulsed (15 psi until 0.10 min) splitless (0.50 min)

liner

4 mm I.D., single taper

sample

79 component semivolatile standard (each at 50 ppm), plus 6 internal standards (each at 40 ppm) in methylene chloride